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![Hitachi_EM Avatar](https://lunarcrush.com/gi/w:24/cr:twitter::978529020303196160.png) Hitachi Electron Microscope [@Hitachi_EM](/creator/twitter/Hitachi_EM) on x 23.5K followers
Created: 2025-07-25 08:32:46 UTC

“Automation of SEM Observation Workflow Using EM Flow Creator”

The rich bounty of information offered by scanning-electron microscopy (SEM), and the relative ease of working with SEM specimens, have made SEM a widely-used tool for measurement, analysis, and observation of fine-grained structure in a broad range of fields, from nanotechnology to semiconductors, electronics, life sciences, and material sciences. Recent advances in information-processing technology have spurred the growth of data-driven R&D models requiring copious input data, creating a demand for SEM techniques capable of quickly and automatically acquiring large quantities of data while reducing the operational burden on users—and the dependence on individual user attributes—required to achieve this automation.
To meet these needs, Hitachi High-Tech developed EM Flow Creator, an automation-support tool capable of flexibly addressing a wide range of requirements across a broad spectrum of fields. In this article we describe key features of EM Flow Creator and illustrate its use through a series of specimen observations.

Read the article here:

![](https://pbs.twimg.com/media/GwsKYqkbgAELZ3s.jpg)

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[Post Link](https://x.com/Hitachi_EM/status/1948662698331570511)